Brian D. Neureuther: search on Z-Library

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1

A hierarchical production plan for a make-to-order steel fabrication plant

Neureuther, Brian D., Polak, George G., Sanders, Nada R.

Journal:

Production Planning & Control

Year:

2004

Language:

english

File:

PDF, 285 KB

english, 2004

2

Conceptualizing Variation and Control Chart Theory

Brian D. Neureuther

Journal:

Decision Sciences Journal of Innovative Education

Year:

2006

Language:

english

File:

PDF, 56 KB

english, 2006

3

Mitigating Supply Chain Vulnerability

Neureuther, Brian D., Kenyon, George

Journal:

Journal of Marketing Channels

Year:

2009

Language:

english

File:

PDF, 335 KB

english, 2009

4

Managing Risks and Disruptions in Global Supply Chains

Neureuther, Brian D.

Journal:

Journal of Marketing Channels

Year:

2009

Language:

english

File:

PDF, 43 KB

english, 2009

5

SPIE Proceedings [SPIE Photomask Technology 2002 - Monterey, CA (Tuesday 1 October 2002)] 22nd Annual BACUS Symposium on Photomask Technology - Performance of repaired defects and attPSM in EUV multilayer masks

Deng, Yunfei, La Fontaine, Bruno, Neureuther, Andrew R., Grenon, Brian J., Kimmel, Kurt R.

Year:

2002

Language:

english

File:

PDF, 511 KB

english, 2002

6

The impact of lot-sizing on net profits and cycle times in the n-job, m-machine job shop with both discrete and batch processing

George Kenyon, Cem Canel, Brian D. Neureuther

Journal:

International Journal of Production Economics

Year:

2005

Language:

english

File:

PDF, 399 KB

english, 2005

7

An Adaptive Model for Assessing Supply Chain Risk

Kenyon, George, Neureuther, Brian D.

Journal:

Journal of Marketing Channels

Year:

2012

Language:

english

File:

PDF, 193 KB

english, 2012

8

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Wednesday 13 September 2000)] 20th Annual BACUS Symposium on Photomask Technology - Modeling defect-feature interactions in the presence of aberrations

Neureuther, Andrew R., Hotta, Shoji, Adam, Konstantinos, Grenon, Brian J., Dao, Giang T.

Year:

2001

Language:

english

File:

PDF, 553 KB

english, 2001

9

Excellence in Supply Chain and Logistics Management

Neureuther, Brian D.

Journal:

Journal of Marketing Channels

Year:

2012

Language:

english

File:

PDF, 61 KB

english, 2012

10

Exploring Labor Reduction in Complex Manufacturing

Neureuther, Brian D., Schikora, Paul F.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2006

Language:

english

File:

PDF, 359 KB

english, 2006

11

SPIE Proceedings [SPIE 18th Annual BACUS Symposium on Photomask Technology and Management - Redwood City, CA (Wednesday 16 September 1998)] 18th Annual BACUS Symposium on Photomask Technology and Management - Effect of reticle CD uniformity on wafer CD uniformity in the presence of scattering-bar optical proximity correction

Adam, Konstantinos, Socha, Robert J., Dusa, Mircea V., Neureuther, Andrew R., Grenon, Brian J., Abboud, Frank E.

Year:

1998

Language:

english

File:

PDF, 446 KB

english, 1998

12

SPIE Proceedings [SPIE Photomask Technology 2002 - Monterey, CA (Tuesday 1 October 2002)] 22nd Annual BACUS Symposium on Photomask Technology - Polarization contact: mask engineering

Lam, Michael, Neureuther, Andrew R., Grenon, Brian J., Kimmel, Kurt R.

Year:

2002

Language:

english

File:

PDF, 88 KB

english, 2002

13

SPIE Proceedings [SPIE Photomask Technology 2002 - Monterey, CA (Tuesday 1 October 2002)] 22nd Annual BACUS Symposium on Photomask Technology - No-fault assurance: linking fast process CAD and EDA

Neureuther, Andrew R., Gennari, Frank E., Grenon, Brian J., Kimmel, Kurt R.

Year:

2002

Language:

english

File:

PDF, 335 KB

english, 2002

14

SPIE Proceedings [SPIE Photomask 2001 - Monterey, CA (Wednesday 3 October 2001)] 21st Annual BACUS Symposium on Photomask Technology - Methodology for accurate and rapid simulation of large arbitrary 2D layouts of advanced photomasks

Adam, Konstantinos, Neureuther, Andrew R., Dao, Giang T., Grenon, Brian J.

Year:

2002

Language:

english

File:

PDF, 492 KB

english, 2002

15

SPIE Proceedings [SPIE Photomask 2001 - Monterey, CA (Wednesday 3 October 2001)] 21st Annual BACUS Symposium on Photomask Technology - Aberrations are a big part of OPC for phase shifting masks

Gennari, Frank E., Neureuther, Andrew R., Dao, Giang T., Grenon, Brian J.

Year:

2002

Language:

english

File:

PDF, 255 KB

english, 2002

16

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Wednesday 13 September 2000)] 20th Annual BACUS Symposium on Photomask Technology - Effects of shifter edge topography on through focus performance

Hotta, Shoji, Pistor, Thomas V., Adam, Konstantinos, Neureuther, Andrew R., Grenon, Brian J., Dao, Giang T.

Year:

2001

File:

PDF, 606 KB

2001

17

Quality Improvement under Budgetary and Life-Cycle Constraints

Neureuther, Brian D., Kenyon, George N.

Journal:

Quality Management Journal

Year:

2004

Language:

english

File:

PDF, 12.91 MB

english, 2004

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